번호 제목 권(호) 출판년도
222

Nano Convergence

Advanced WBG Power Semiconductor Packaging: Nanomaterials and Nanotechnologies for High-Performance Die Attach Paste

Young-Min Ju, Tae-Wan Kim, Seung-Hyun Lee, Jinho Ahn and Hak-Sung Kim

(Submitted) 99999.99.9
221

Applied Surface Science Advances

Measurement of interfacial adhesion strength of Copper-Silicon based dielectric interfaces via laser spallation test

Young-Min Ju, Dukyong Kim, Se-Min Lee, Heuisu Kim, Daewoong Lee, Yeontaek Hwang, Seung Hwan Lee and Hak-Sung Kim

(Accepted) 9999.99.99
220

Polymer Testing

Non-destructive evaluation of PET thermal degradation using terahertz time domain spectroscopy

Tae-Wan Kim, Sang-Il Kim, Hyun-Jin Jung, Heon-Su Kim, Chang-Jin Moon and Hak-Sung Kim

(Submitted) 9999.99.99
219

Transactions on Pattern Analysis and Machine Intelligence

Fast warpage prediction of printed circuit board with the automatically classified copper patterns for anisotropic viscoelastic homogenization

Woong-Kyoo Yoo,Jeong-Hyeon Baek,Jong-Whi Park,Hak-Sung Kim

(Submitted) 9999.99.99
218

NDT & E International

In-situ inspection of stealth laser diced internal crack lines in silicon wafer using cepstrum signal processing with terahertz electro-magnetic wave

Heon-Su Kim, Sang-Il Kim, Tae-Wan Kim, Jin-Sang Lim, Dong-Su Han, Hae-Gu Lee, and Hak-Sung Kim

(Sumitted) 9999.99.99